| Quartz Deposition Rate Monitor |
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Industry standard deposition rate/thickness monitor for control of thin film deposition. The QO 40A1 quartz deposition rate monitor provides a real-time, progressive indication of coating thickness during deposition, allowing the production of coatings of high accuracy and reproducibility. The thickness of both evaporated and sputter coated films can be monitored. The sensor head is a water cooled, non-magnetic housing which is permanently positioned in the vacuum system. The crystal face is parallel to the water cooling feedthrough pipes. The QO 40A1 is mounted on a DN 40CF flange with two 3mm O.D. pipes and Microdot S-50 coaxial connector. Additional Information:
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