Focussed Electron Source

Low cost focussed electron source for AES, EELS and electron pulse/desorption experiments.

The ES 40C1 Electron Source is a scanning electron source with small spot profile. Due to the high transmission of its Einzel-Lens, the ES 40C delivers a high electron beam current over a wide energy range. The source insertion depth and shielding material (mu-metal or copper) can be chosen to match specific experimental requirements.

Application
The ES 40C1 is designed for a stable and reliable operation in e.g. AES, scanning applications,imaging, EELS and electron pulse or desorption experiments.

You can download teh data sheet here;  icon Prevac Scanning Electron Source ES40 C1

ES40C1 Focussed/Scanning Electron Source:

  • 20eV...5keV
  • up tp 200μA
  • DN40CF mounting flange
  • 32mm working distance
  • 155mm insertion
  • 10x10mm scan area
  • mu-metal shield option
  • fine focus microformed tip cathode
  • electron source power supply ES40C-PS
  • full software control, web enabled

 

Focussed Electron Source EELS Imaging

Power Supply:

 Creator Software Module:

Focussed Electron Source EELS Imaging SupplyFocussed Electron Source EELS Imaging Software
  
 Dimensions:
 
 Focussed Electron Source EELS Imaging Schematic

 

ES40C1 Focussed Electron Source Specifications: 
electron energy
20eV...5keV
currentup to 200μA
insertion155mm
working distance
32mm
mounting flange
DN40CF
bakeout
250oC
communications
ethernet IP (many others on request)
web enabled
yes

Please use our contact form to request a full catalogue or to discuss your requirements with us.

 
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