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Low cost focussed electron source for AES, EELS and electron pulse/desorption experiments.
The ES 40C1 Electron Source is a scanning electron source with small spot profile. Due to the high transmission of its Einzel-Lens, the ES 40C delivers a high electron beam current over a wide energy range. The source insertion depth and shielding material (mu-metal or copper) can be chosen to match specific experimental requirements.
Application The ES 40C1 is designed for a stable and reliable operation in e.g. AES, scanning applications,imaging, EELS and electron pulse or desorption experiments. You can download teh data sheet here; Prevac Scanning Electron Source ES40 C1 ES40C1 Focussed/Scanning Electron Source: - 20eV...5keV
- up tp 200μA
- DN40CF mounting flange
- 32mm working distance
- 155mm insertion
- 10x10mm scan area
- mu-metal shield option
- fine focus microformed tip cathode
- electron source power supply ES40C-PS
- full software control, web enabled
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Power Supply: | Creator Software Module: |  |  | | | | Dimensions:
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| ES40C1 Focussed Electron Source Specifications: | | electron energy
| 20eV...5keV
| | current | up to 200μA | | insertion | 155mm | working distance
| 32mm | mounting flange
| DN40CF | bakeout
| 250oC | communications
| ethernet IP (many others on request)
| web enabled
| yes |
Please use our contact form to request a full catalogue or to discuss your requirements with us. |