| Focussed Ion Gun for SIMS/ESCA/XPS |
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Focussed and scanning argon ion gun for SIMS/ESCA/XPS depth profiling applications. The IS 40E1 scanning ion source is a two lens extractor type focussed ion gun for depth profiling in SIMS/XPS/ESCA applications. The two lens system allows easy and continuous variation of spot size over the primary energy range of 0.15 keV to 5 keV and with beam current density of up to 25 μA/cm2. The slim profile and specially designed nose-cone angle of 50° ensure best fit even in crowded chamber environments. The filament is non-line-of-sight to the sample, thereby minimising contamination from the source. It is field replaceable with non-critical alignment and long lifetime, making replacement both quick and economical compared with other designs. The yttria coated iridium filament operates are considerably lower operating temperatures than other cathodes, greatly reducing beam contamination. Additionally the cathode allows operation with reactive gases such as O2, H2 and hydrocarbons, but with correspondingly reduced lifetime. The scanning area is 10x10 mm at the standard working distance of 23 mm and the sputter crater is extremely homogeneous over the scan area. This results in precise depth profiles with maximum depth resolution. There are two ports for differential pumping. In usual operation the first differential pumping stage is linked to the pumping line of the second differential stage via a throttle valve. The second differential stage utilises the host UHV system pump set. The source is supplied with an all metal bakeable UHV gas inlet with fine adjust leak valve. As an option, a Wien Mass Filter may be retrofitted for elimination of unwanted isotopes, impurities, multiply charged ions and neutral species. Standard insertion length is 163mm and mounting flange is a rotatable DN 40CF. You can download the data sheet here;
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