MAX- SIMS Quadrupole Mass Spectrometers

High performance SIMS quadrupole mass spectrometers.

The MAX-SIMS quadrupole mass spectrometer is a high performance bolt-on instrument for static and dynamic SIMS applicatioMAX SIMS Quadrupole Mass Spectrometerns.

The MAX-SIMS is based on our high performance 19mm triple quadrupole mass filter, delivering exceptional transmission and resolution characteristics.


MAX - SIMS Quadrupole Mass Spectrometer Features:

  • 19mm high transmission and resolution triple quadrupole mass filter
  • Mass range options to 4000amu
  • Static and Dynamic SIMS
  • Front end ion optics stack
  • Axial and right angle configurations
  • High sensitivity (10mA/Torr) internal ionizer for vacuum diagnostics and SNMS
  • >1E6cps/nA for OFHC copper with 2nA primary beam at 1E-8mbar chamber pressure
  • 1E-16mbar detection capability
  • High transmission energy filter with <0.5eV energy resolution
  • Low noise positive and negative ion counting detector with conversion dynode


MAX - SIMS Quadrupole Mass Spectrometer Selected Articles:

Photochemistry of photoresists and underlayer materials upon irradiation at 13.5 nm. G. H. ho et. al., Department of Applied Chemistry, National University of Kaohsiung, No. 700, Kaohsiung University Road, Nanzih, Kaohsiung 811, Taiwan. doi:10.1016/j.jphotochem.2010.02.008

Static secondary ion mass spectrometry (S-SIMS) for the characterization of surface components in mineral particulates. R. Van Ham et. al., Department of Chemistry, University of Antwerp, Universiteitsplein 1, B-2610 Antwerp, Belgium. doi:10.1016/j.talanta.2005.09.012

Low energy electron stimulated desorption of ions from whole human blood. Sylwia Ptasinska et. al., Groupe en Sciences des Radiations, Faculté de Médecine, Université de Sherbrooke, Sherbrooke, Québec, Canada J1H 5N4. doi:10.1016/j.ijms.2007.01.022

Semi-quantitative characterisation of binary salt mixtures with static secondary ion mass spectrometry (S-SIMS). A. Adriaens et. al., Ghent University, Department of Analytical Chemistry, Krijgslaan 281-S12, B 9000 Ghent, Belgium. doi:10.1016/j.ijms.2005.07.010


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